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Measurement of ion‐induced secondary electron emission yield of MgO films by pulsed ion beam method

✍ Scribed by Lee, Sang Kook; Kim, Jae Hong; Lee, Ji Hwa; Whang, Ki Woong


Book ID
126947270
Publisher
Informa UK (Taylor & Francis)
Year
2002
Tongue
English
Weight
367 KB
Volume
3
Category
Article
ISSN
1598-0316

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