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Measurement of ion residence times in a commercial electron impact ion source

✍ Scribed by K. Meier; J. Seibl

Publisher: Elsevier Science
Year: 1974
Weight: 517 KB
Volume: 14
Category: Article
ISSN: 0020-7381
DOI: 10.1016/0020-7381(74)80065-3

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