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Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results

✍ Scribed by L. Delannay; R.E. Logé; Y. Chastel; J.W. Signorelli; P. Van Houtte

Publisher: John Wiley and Sons
Year: 2003
Tongue: English
Weight: 229 KB
Volume: 5
Category: Article
ISSN: 1438-1656
DOI: 10.1002/adem.200300376

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