✦ LIBER ✦
Measurement of Harmonic Reflections - An X-Ray Method for Real Structure Analysis of Semiconducting Compounds
✍ Scribed by Mücklich, F. ;Oettel, H.
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 676 KB
- Volume
- 129
- Category
- Article
- ISSN
- 0031-8965
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