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Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope

✍ Scribed by Hong, J. W.; Park, Sang-il; Khim, Z. G.


Book ID
119965578
Publisher
American Institute of Physics
Year
1999
Tongue
English
Weight
601 KB
Volume
70
Category
Article
ISSN
0034-6748

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