✦ LIBER ✦
Measurement of generation lifetime in thin silicon layers : T. E. Hof, T. J. Morthorst and K. P. Roenker. Solid-St. Electron.31, 937 (1988)
- Book ID
- 103281426
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 137 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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