Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

✍ Scribed by Kyu-Haeng Lee; Wook-Rae Cho; Jung-Ho Park; Jong-Sup Kim; Seung-Han Park; Ung Kim

• Book ID: 115420419
• Publisher: Optical Society of America
• Year: 1994
• Tongue: English
• Weight: 303 KB
• Volume: 19
• Category: Article
• ISSN: 0146-9592
• DOI: 10.1364/OL.19.001116