Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature

✍ Scribed by Qiu, W.; Terai, H.; Wang, Z.

• Book ID: 118177232
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 309 KB
• Volume: 21
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/tasc.2010.2081653