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Measurement of Electric-Field-Induced Displacements in (Pb, La)TiO 3 Thin Films Using Scanning Probe Microscopy

✍ Scribed by Maiwa, Hiroshi; Ichinose, Noboru


Book ID
124086576
Publisher
Institute of Pure and Applied Physics
Year
2000
Tongue
English
Weight
198 KB
Volume
39
Category
Article
ISSN
0021-4922

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