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Measurement of drift velocity of electrons in silicon by exciting a diode structure with short superradiant laser pulses

✍ Scribed by Tove, P.A.; Andersson, G.; Ericsson, G.; Lidholt, R.


Book ID
114589888
Publisher
IEEE
Year
1970
Tongue
English
Weight
466 KB
Volume
17
Category
Article
ISSN
0018-9383

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