Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram

✍ Scribed by K. Du; Y.M. Wang; H. Lichte; H.Q. Ye

• Book ID: 108210313
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 585 KB
• Volume: 37
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/j.micron.2005.05.007