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Measurement of buried oxide thermal conductivity for accurate electrothermal simulation of SOI device

✍ Scribed by Tenbroek, B.M.; Bunyan, R.J.T.; Whiting, G.; Redman-White, W.; Uren, M.J.; Brunson, K.M.; Lee, M.S.L.; Edwards, C.F.

Book ID: 114537541
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 108 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.737466

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