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Measurement of beam waist for an optical cavity based on Gouy phase

โœ Scribed by You, Yan; Urakawa, Junji; Rawankar, Arpit; Aryshev, Alexander; Shimizu, Hirotaka; Honda, Yosuke; Yan, Lixin; Huang, Wenhui; Tang, Chuanxiang

Book ID
119333213
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
498 KB
Volume
694
Category
Article
ISSN
0168-9002

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We have proposed an optical method that can be applied to in-process or in situ measurement of the microsurface profile. The present method is based on optically performed spectral analysis and the phase retrieval technique. Spectral information of a surface profile is obtained by measuring the Frau