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Measurement of attraction force between AFM tip and surface of dielectric thin films with DC-bias

✍ Scribed by Y.F. Zhu; C.H. Xu; B. Wang; C.H. Woo

Book ID: 116374386
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 138 KB
Volume: 33
Category: Article
ISSN: 0927-0256
DOI: 10.1016/j.commatsci.2004.12.033

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