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Measurement of Anisotropic Biaxial Stresses in Si 1- x Ge x /Si Mesa Structures by Oil-Immersion Raman Spectroscopy

✍ Scribed by Kosemura, Daisuke; Tomita, Motohiro; Usuda, Koji; Tezuka, Tsutomu; Ogura, Atsushi


Book ID
120284014
Publisher
Institute of Pure and Applied Physics
Year
2013
Tongue
English
Weight
721 KB
Volume
52
Category
Article
ISSN
0021-4922

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