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Measurement of absolute stopping cross sections by backscattering in thin dielectric films

✍ Scribed by E.E. Khawaja; S.M.A. Durrani; A.B. Hallak; M.A. Daous

Book ID
113284865
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
566 KB
Volume
95
Category
Article
ISSN
0168-583X

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## Abstract By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross‐sections of magnetite (Fe~3~O~4~) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of