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Measurement determination of in-plane residual stresses in thin silicon oxide films of different thicknesses by shadow Moire interferometry : Ghaffari, K.; Wang, B.; Danyluk, S. ASNT 1994 Fall Conference and Quality Testing Show, Atlanta Georgia (United States), 19–23 Sep. 1994. pp. 77–78. ASNT (1994) ISBN 1-57117-002-2


Book ID
108477536
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
150 KB
Volume
31
Category
Article
ISSN
0963-8695

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