✦ LIBER ✦
Measurement by means of Widmanstätten pattern of the thickness of a thin metallic film for examination in the electron microscope: N. Takahashi, C.R. Acad. Sci., (France), 257 (6), 29 July 1963 1029–1032
- Publisher
- Elsevier Science
- Year
- 1964
- Tongue
- English
- Weight
- 73 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0042-207X
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