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Measurement by means of Widmanstätten pattern of the thickness of a thin metallic film for examination in the electron microscope: N. Takahashi, C.R. Acad. Sci., (France), 257 (6), 29 July 1963 1029–1032


Publisher
Elsevier Science
Year
1964
Tongue
English
Weight
73 KB
Volume
14
Category
Article
ISSN
0042-207X

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