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Measurement-based load modeling: Theory and application

✍ Scribed by Ma Jin; Han Dong; RenMu He


Book ID
107354982
Publisher
SP Science China Press
Year
2007
Tongue
English
Weight
851 KB
Volume
50
Category
Article
ISSN
1006-9321

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## Abstract The evanescent field surrounding an exposed planar waveguide in silica is accurately measured using scanning near field optical microscopy (SNOM) and compared to models of the field distribution. Distortions in the field due to edge effects and the proximity of the mode to the surface a