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Measurement and Modeling of Carrier Transport Parameters Applicable to SiGe BiCMOS Technology Operating in Extreme Environments

✍ Scribed by Moen, K.A.; Cressler, J.D.

Book ID: 111953661
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 376 KB
Volume: 57
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2038033

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