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Measurement and Modeling of a High-Linearity Modified Uni-Traveling Carrier Photodiode

✍ Scribed by Beling, A.; Pan, H.; Hao Chen; Campbell, J.C.

Book ID: 119804689
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 107 KB
Volume: 20
Category: Article
ISSN: 1041-1135
DOI: 10.1109/lpt.2008.926016

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## Abstract A typical uni‐traveling carrier photodiode (UTC‐PD) and a commercial PIN‐PD are compared in the context of the analog performance at 10 GHz in a realistic noise environment.The behavior of the carrier‐to‐noise ratio (CNR), the linearity, represented by the third‐order output intercept p