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Measurement and analysis of thin- and thick-target yield curves of narrow resonances with a high energy resolution ion beam

✍ Scribed by W.H. Schulte; H. Ebbing; H.W. Becker; S. Wüstenbecker; M. Berheide; M. Buschmann; C. Rolfs; G.E. Mitchell; J.S. Schweitzer


Book ID
113282962
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
390 KB
Volume
64
Category
Article
ISSN
0168-583X

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