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Measured radiation damage in charge coupled devices exposed to simulated deep orbit proton fluxes

✍ Scribed by Alan Owens; Kieran J. McCarthy; Alan Wells; Wojtek Hajdas; Felix Mattenberger; Alex Zehnder; Oleg Terekhov


Book ID
107922948
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
831 KB
Volume
361
Category
Article
ISSN
0168-9002

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