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MBE growth and post-growth annealing of GaAs-based resonant tunneling structures, viewed in relation to interface roughness

✍ Scribed by H. Riechert; D. Bernklau; J.-P. Reithmaier; R.D. Schnell


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
407 KB
Volume
111
Category
Article
ISSN
0022-0248

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