Maximum likelihood estimation of parameters of several continuous and discrete failure distributions : K. K. Govil and K. K. Aggarwal. Microelectron. Reliab.23 (1), 169 (1983)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 129 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90849-1