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Maximum entropy deconvolution of dielectric and impedance data

✍ Scribed by T.J. vanderNoot


Publisher
Elsevier
Year
1995
Tongue
English
Weight
602 KB
Volume
386
Category
Article
ISSN
1572-6657

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The maximum entropy method (MEM) is applied to the deconvolution of x-ray photoelectron spectra. This method provides the least-biased estimate of the unbroadened spectrum by using the Shannon information content as the regularizing functional. The large-scale, non-linear optimization problem is sol