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Maximum ease of testability of logic circuits with respect to multiple stuck-on faults

✍ Scribed by N. D. Stukach

Publisher: Springer US
Year: 1992
Tongue: English
Weight: 561 KB
Volume: 28
Category: Article
ISSN: 1573-8337
DOI: 10.1007/bf01125126

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Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring : Niraj K. Jha and Qiao Tong. Comput. Elect. Engng16(3), 115 (1990)

📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 135 KB