Materials Characterization Using Nondestructive Evaluation (NDE) Methods

✍ Scribed by Altpeter, Iris; Herrmann, Hans-Georg; Hübschen, Gerhard; Tschuncky, Ralf

• Publisher: Woodhead Publishing
• Year: 2016
• Tongue: English
• Leaves: 307
• Series: Woodhead Publishing series in electronic and optical materials 88
• Edition: 1
• Category: Library

✦ Synopsis

Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures.

Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries.

Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.

• Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques
• Reviews the determination of microstructural and mechanical properties
• Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries
• Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

✦ Table of Contents

Content:
Related titles,Front Matter,Copyright,List of contributors,Woodhead Publishing Series in Electronic and Optical MaterialsEntitled to full text1 - Atomic force microscopy (AFM) for materials characterization, Pages 1-16, M.K. Khan, Q.Y. Wang, M.E. Fitzpatrick
2 - Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization, Pages 17-43, B.J. Inkson
3 - X-ray microtomography for materials characterization, Pages 45-79, R. Hanke, T. Fuchs, M. Salamon, S. Zabler
4 - X-ray diffraction (XRD) techniques for materials characterization, Pages 81-124, J. Epp
5 - Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization, Pages 125-159, C. Sklarczyk
6 - Acoustic microscopy for materials characterization, Pages 161-175, R.Gr. Maev
7 - Ultrasonic techniques for materials characterization, Pages 177-224, G. Hübschen
8 - Electromagnetic techniques for materials characterization, Pages 225-262, I. Altpeter, R. Tschuncky, K. Szielasko
9 - Hybrid methods for materials characterization, Pages 263-291, R. Tschuncky, K. Szielasko, I. Altpeter
Index, Pages 293-303