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Material characterization of thick film-resistor pastes : Jayant S. Shah and Walter C. Hahn. IEEE Trans. Components, Hybrids, Mfg Technol. Chmt-1, (4) 383 (December 1978)

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 132 KB
Volume: 19
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(79)90133-1

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