Mass spectrometric investigation of polyfluorinated C60. Evidence for the existence of C60F2n (n = 0–30)

✍ Scribed by Swapan K. Chowdhury; Stephen D. Cameron; Donald M. Cox; Krzysztof Kniaz; Robert A. Strongin; Maria A. Cichy; John E. Fischer; Amos B. Smith III

• Publisher: John Wiley and Sons
• Year: 1993
• Tongue: English
• Weight: 659 KB
• Volume: 28
• Category: Article
• ISSN: 1076-5174
• DOI: 10.1002/oms.1210280807

✦ Synopsis

Abstract

Electron‐capture negative ion chemical ionization (EC‐NICI) and field desorption (FD) mass spectrometric techniques were utilized to examine polyfluorinated C~60~. Two different samples from the same preparation, one prior to sublimation and the other sublimed material, were investigated. From the raw non‐sublimed product in EC‐NCI six series of ions corresponding to different numbers of attached oxygen atoms were obtained, which are represented by the formula [C~60~F~2__n__~O~m~]^−^, where n ranged from 0 to 30 and m from 0 to 5. The sublimed material in EC‐NICI produced the same six series of ions with up to 48 fluorine atoms attached to C~60~. The field desorption of the same sample produced similar results, but the signal‐to‐noise ratios of the spectra were low. Both samples, in the two different techniques examined, yielded C~60~F~60~ ions with only an even number of fluorine atoms attached. The present investigation, for the first time, provides direct experimental evidence for the existence of higher fluorinated C~60~ up to C~60~F~60~ and multiple oxides of polyfluoro‐C~60~ with up to five oxygen atoms attached.