Resonant electron capture by C 60 and C 70 was studied and it was established that long-lived (i.e. mass spectrometrically observable) parent negative ions are formed within an extremely broad energy region (0-14 eV). It has been shown that effective yield curves of C 60 -and C 70 -in the thermal en
Mass Spectrometric Investigation of Fullerenes. II. Determination of the Electron Impact Cross-section of C 60 and C 70
✍ Scribed by Arkadij Popovič
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 698 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0951-4198
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✦ Synopsis
Absolute and relative ionization cross sections of C, and C70 were measured in the range from threshold to 100eV, using a Knudsen cell mass spectrometric method. Pb was used as internal standard to calibrate the instrument sensitivity on an absolute scale. The vapour pressure of the fullerenes was obtained by a mass loss method as (0.230*5%) Pa at 757 K and (0.429*5%) Pa at 843 K for C, and C7, respectively. In order to avoid artifacts in the ionization efficiency curve (IEC) shapes, special attention was devoted to the ion source construction, the performance of which was tested using a Ag-A1 alloy. The maximum partial ionization cross sections, a(C&/C,) and U(C~~/C,) at 48 eV were found to be (80k20)x10-'6cm2 whereas for (C$/C,) and (C;;/C7@) processes the maximum ionization cross sections at 80 eV were measured to be (10.0k2.7) x cm2 and (12.0k2.7) x cm2 respectively.
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