𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Market Overview: Sensors for Scanning Force Microscopy

✍ Scribed by U. Grunewald; S. Müller-Pfeiffer

Book ID
101392381
Publisher
John Wiley and Sons
Year
1998
Weight
154 KB
Volume
3
Category
Article
ISSN
1432-2404

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Sensors for scanning probe microscopy
Sensors for scanning probe microscopy
✍ R. Kassing; I.W. Rangelow; E. Oesterschulze; M. Stuke 📂 Article 📅 2003 🏛 Springer 🌐 English ⚖ 386 KB
Magnetically refined tips for Scanning F
Magnetically refined tips for Scanning Force Microscopy
✍ R. Jumpertz; P. Leinenbach; A.W.A. van der Hart; J. Schelten 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 372 KB

Cantilever probes with integrated tips are commercially available. They are routinely used for atomic force microscopy (AFM). For such probes a magnetic refinement of the silicon tip has been developed which results in a deposition of ferromagnetic materials like Nickel or CrCoTa at the top area of

Detection and Momentum Spectrometry of S
Detection and Momentum Spectrometry of Single Microparticles by Scanning Force Microscopy Sensors
✍ Wurster, Roland 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 313 KB 👁 1 views

The high sensitivity of a scanning force microscopy lever is exploited for the measurement of the inertial forces exerted on it by impacting gas jets and single particles. Similar to a ballistic pendulum, a lever with an integrated piezoresistive deÑection sensor was arranged perpendicular to a micr