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Mapping the damaged zone around the crack tip in high density polyethylene with synchrotron microfocus small angle X-ray scattering technique

✍ Scribed by Yu-jing Tang; Zhi-yong Jiang; Hans-Friedrich Enderle; Dieter Lilge; Stephan V. Roth; Rainer Gehrke; Jens Rieger; Li-jia An; Yong-feng Men


Book ID
106280644
Publisher
Institute of Chemistry Chinese Academy of Sciences
Year
2010
Tongue
English
Weight
569 KB
Volume
28
Category
Article
ISSN
0256-7679

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