Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data. Erratum

✍ Scribed by Nikulin, A. Yu. ;Sakata, O. ;Hashizume, H. ;Petrashen, P. V.

• Book ID: 114500891
• Publisher: International Union of Crystallography
• Year: 1994
• Tongue: English
• Weight: 98 KB
• Volume: 27
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889894006199