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Mapping and Quantitative Trait Loci Analysis of Verticillium Wilt Resistance Genes in Cotton

✍ Scribed by Hong-Mei Wang; Zhong-Xu Lin; Xian-Long Zhang; Wei Chen; Xiao-Ping Guo; Yi-Chun Nie; Yun-Hai Li


Book ID
111330829
Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
715 KB
Volume
50
Category
Article
ISSN
1672-9072

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