Malfunction of digital circuits caused by noise induced in breaking electric contacts

✍ Scribed by Keiichi Uchimura; Junji Michida; Shinji Nozu; Teizo Aida

• Book ID: 112075795
• Publisher: John Wiley and Sons
• Year: 1989
• Tongue: English
• Weight: 630 KB
• Volume: 72
• Category: Article
• ISSN: 8756-6621
• DOI: 10.1002/ecja.4410720607