Majority and minority carrier lifetime in MOS structures : G. Baccarani and C. A. Baffoni, and M. Rudan and G. Spadini. Solid State Electronics18, 1115 (1975)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 121 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90345-0