Magnetoresistance measurement of unpatterned magnetic tunnel junction wafers by current-in-plane tunneling

✍ Scribed by Worledge, D. C.; Trouilloud, P. L.

• Book ID: 124069466
• Publisher: American Institute of Physics
• Year: 2003
• Tongue: English
• Weight: 246 KB
• Volume: 83
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1590740