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Magnetization reversal studies of continuous and patterned exchange biased NiFe/FeMn thin films

✍ Scribed by Mohanty, J.; Vandezande, S.; Brems, S.; Bael, M. J.; Charlton, T.; Langridge, S.; Dalgliesh, R. M.; Temst, K.; Haesendonck, C.


Book ID
118782160
Publisher
Springer
Year
2012
Tongue
English
Weight
787 KB
Volume
109
Category
Article
ISSN
1432-0630

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