Samples consisting of 75 nm Ni films deposited on Si substrates were bent mechanically and irradiated with 200 keV Xe-ions at a dose of 4 • 10 14 ions/cm 2 . Magneto-optical Kerr effect, Rutherford backscattering spectrometry and X-ray diffraction were used to investigate the changes in the magnetic
✦ LIBER ✦
Magnetic modifications of thin CoFe films induced by Xe+-ion irradiation
✍ Scribed by Ratnesh Gupta; G.A. Müller; P. Schaaf; K. Zhang; K.P. Lieb
- Book ID
- 113822707
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 530 KB
- Volume
- 216
- Category
- Article
- ISSN
- 0168-583X
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