Magnetic force microscopy of iron oxide
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Yu Zhang; Mo Yang; Mihrimah Ozkan; Cengiz S. Ozkan
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Article
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2009
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American Institute of Chemical Engineers
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English
⚖ 501 KB
## Abstract Magnetic force microscopy has the capability to detect magnetic domains from a close distance, which can provide the magnetic force gradient image of the scanned samples and also simultaneously obtain atomic force microscope (AFM) topography image as well as AFM phase image. In this wor