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Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction

โœ Scribed by Alvarez, Tony; Kalinin, Sergei V.; Bonnell, Dawn A.

Book ID
120372613
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
476 KB
Volume
78
Category
Article
ISSN
0003-6951

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In integrated circuit failure analysis excessive current flow is often used to indicate the presence of faulty devices. By imaging the magnetic field produced by current flowing in integrated circuit conductors, these faulty devices can be located. Fault location by magnetic field imaging can be pro