Magnetic domain walls at the edge of patterned NiO/NiFe bilayers

✍ Scribed by Kim, S. W. ;Lee, S. S. ;Gomez, R. D. ;Hahn, E. J. ;Hwang, D. G.

• Book ID: 105363374
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 682 KB
• Volume: 203
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200521168

✦ Synopsis

Abstract

The magnetic domain walls at the edges of a large patterned and exchange‐biased NiO (10–60 nm)/NiFe (10 nm) bilayers and their motions with applied field were investigated by MFM. Three kinds of domain walls were found at the edges of the NiO (30 nm)/NiFe (10 nm) bilayer having the exchange biasing field (H~ex~) of 21 Oe. Two zigzag charged walls and Néel wall appeared at the edges perpendicular and parallel to H~ex~, respectively. The zigzag charged walls are nearly a factor of three wider than the Néel wall, and were not observed for the strong exchange‐biased bilayer (60 nm NiO, H ~ex~ = 75 Oe). We investigated the subsequent motion of the walls, and identified the pinning and nucleation sites during magnetization reversal. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)