Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy

✍ Scribed by Y.M. Chang; Minn-Tsong Lin; W. Pan; C.H. Ho; Y.D. Yao; O. de Haas; R. Schäfer; C.M. Schneider

• Book ID: 114225077
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 189 KB
• Volume: 239
• Category: Article
• ISSN: 0304-8853
• DOI: 10.1016/s0304-8853(01)00670-9