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Magnetic bubble propagation for the dual conductor current-access test circuit: T. Kawasaki, T. Tsuruoka, H. Akiyama, K. Kawamura and T. Miyashita Microelectronics J. 12 (5) (1981)


Book ID
108361219
Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
91 KB
Volume
14
Category
Article
ISSN
0026-2692

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