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Magnetic and microwave resonance characterization of ion beam sputtered amorphous FexNi80-xB15Si5 films

โœ Scribed by Oliver, S.A.; Harris, V.; Ryu, J.; Vittoria, C.


Book ID
114548613
Publisher
IEEE
Year
1989
Tongue
English
Weight
327 KB
Volume
25
Category
Article
ISSN
0018-9464

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