Magnetic and Electrical Properties of Magnetic Tunnel Junctions With Radical Oxidized MgO Barriers

✍ Scribed by Oh, S.C.; Jeong, J.H.; Nam, K.T.; Lee, J.E.; Park, S.O.; Kim, H.S.; Chung, U.-I.; Moon, J.T.

• Book ID: 114651624
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 145 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2006.881276