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Lumped model analysis of semiconductor devices using the NET-2 circuit/system analysis program: Raymond, J. P. and Krebs, M. G.IEEE Trans. on Nuclear Sci., Vol NS-19, No 6 (December 1972), pp 103–107


Book ID
103042998
Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
129 KB
Volume
5
Category
Article
ISSN
0010-4485

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