LSI yield projections based upon test pattern results: an application to multilevel metal structures : A. P. Turley. IEEE Trans. on Parts, Hybrids and Packaging. PHP-10, 230 (1974)

• Book ID: 103273101
• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 261 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90580-6