✦ LIBER ✦
LSI failure analysis using an electron-beam tester directly combined to an LSI tester : Hiroyuki Hosol, Motofumi Kudoh, Kiyoshi Nikawa and Tokuo Ohiwa. Proc. 15th Symp. Reliab. Maintainab. (Union of Japanese Scientists and Engineers, Tokyo), 61 (1985)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 129 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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